Functions and Features

High-Speed, High-Precision Control: XY-axis movement speed ranges from 0.1 to 250 mm/sec (hardware specification), enabling precise control of every test point
Multi-Speed Z-Axis Adjustment: Supports Z-axis speeds from 0.1 to 50 mm/sec to meet diverse testing requirements
Multiple Force-Feedback Specifications: Offers two selectable force-feedback ranges (50g~500g ±2% or 0.02~0.5 kgf ±2%)
Flexible Positioning Methods: Supports corner-point positioning, cross-alignment, and automatic edge detection, along with multiple touch-test modes
Versatile Communication Interfaces: Compatible with Android WiFi 5.1 systems and wired connection modules
High-Density Test Points: Supports up to 200 × 200 test points (minimum spacing 2.5~3.5 mm depending on click-density requirements), fully covering large touch-panel sizes
Multi-Path Synchronous Testing: Capable of executing multiple point-path tests simultaneously to increase efficiency
Comprehensive Test Conditions: Supports sensitivity, accuracy, linear error, delayed tapping, response time, and more
Fast Report Generation: Allows customizable report-generation functions based on measurement requirements, improving data-analysis productivity
Advanced Statistical Analysis: Built-in error-simulation tools and multiple statistical-report formats for more complete analysis
Support for Complex Test Modes: Simulates two-finger/multi-finger rotation, sliding, pinch-open, pinch-close, and other advanced gestures

Specification

TEL : +886 3 2755528
FAX: +886 3 2755529
service@innotek-applied.com